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AT24C11
2. Memory Organization
AT24C11, 1K SERIAL EEPROM: Internally organized with 32 pages of 4 bytes each. The 1K
requires a 7-bit data word address for random word addressing. Access to one additional page
(33rd page) available upon request.
Table 2-1.
Pin Capacitance
Applicable over recommended operating range from T A = 25 ° C, f = 1.0 MHz, V CC = +1.8V.
Symbol
C I/O
C IN
Test Condition
Input/Output Capacitance (SDA)
Input Capacitance (A0, A1, A2, SCL)
Max
8
6
Units
pF
pF
Condition
V I/O = 0V
V IN = 0V
Table 2-2.
DC Characteristics
Applicable over recommended operating range from: T AI = – 40 ° C to +85 ° C, V CC = +1.8V to +5.5V, V CC = +2.7V to +5.5V
(unless otherwise noted)
Symbol
V CC1
V CC2
V CC3
V CC4
I CC
I CC
I SB1
I SB2
I SB3
I SB4
I LI
I LO
Parameter
Supply Voltage
Supply Voltage
Supply Voltage
Supply Voltage
Supply Current V CC = 5.0V
Supply Current V CC = 5.0V
Standby Current V CC = 1.8V
Standby Current V CC = 2.5V
Standby Current V CC = 2.7V
Standby Current V CC = 5.0V
Input Leakage Current
Output Leakage Current
Test Condition
READ at 100 kHz
WRITE at 100 kHz
V IN = V CC or V SS
V IN = V CC or V SS
V IN = V CC or V SS
V IN = V CC or V SS
V IN = V CC or V SS
V OUT = V CC or V SS
Min
1.8
2.5
2.7
4.5
Typ
0.4
2.0
0.6
1.4
1.6
8.0
0.10
0.05
Max
5.5
5.5
5.5
5.5
1.0
3.0
3.0
4.0
4.0
18.0
3.0
3.0
Units
V
V
V
V
mA
mA
μA
μA
μA
μA
μA
μA
Input Low Level
Input High Level
V IL
V IH
V OL2
V OL1
(1)
(1)
Output Low Level V CC = 3.0V
Output Low Level V CC = 1.8V
I OL = 2.1 mA
I OL = 0.15 mA
–0.6
V CC × 0.7
V CC × 0.3
V CC + 0.5
0.4
0.2
V
V
V
V
Note:
1. V IL min and V IH max are reference only and are not tested.
3
3409G–SEEPR–8/07
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